Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide /
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| Main Author: | |
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| Other Authors: | , |
| Format: | Government Document Book |
| Language: | English |
| Published: |
Washington, DC : [Springfield, Va.] :
National Aeronautics and Space Administration ; [National Technical Information Service, distributor],
[1988]
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| Series: | NASA technical translation
20332. |
| Subjects: |