Ellipsometry in the measurement of surfaces and thin films.

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Bibliographic Details
Corporate Authors:	Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Washington, D.C., United States. National Bureau of Standards
Other Authors:	Passaglia, Elio (Editor), Stromberg, R. R. (Editor), Kruger, Jerome (Editor)
Format:	Government Document Conference Proceeding Book
Language:	English
Published:	Washington : U. S. Dept. of Commerce, National Bureau of Standards, 1964.
Subjects:	Polarization (Light) Surfaces (Technology) Thin films.

University of Minnesota

Holdings details from University of Minnesota
Call Number:	535.5 Sy687 C 13.10:256