Data mining, intrusion detection, information assurance, and data networks security 2005 : 28-29 March 2005, Orlando, Florida, USA /
Saved in:
Corporate Authors: | , |
---|---|
Other Authors: | |
Format: | Book |
Language: | English |
Published: |
Bellingham, Wash. :
SPIE,
c2005.
|
Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5812. |
Subjects: |