Interferometric metrology : 20-21 August 1987, San Diego, California /

Saved in:

Bibliographic Details
Corporate Authors:	Society of Photo-Optical Instrumentation Engineers, International Technical Symposium on Optical & Optoelectronic Applied Science & Engineering
Other Authors:	Massie, N. A.
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, ©1988.
Series:	Critical reviews of optical science and technology Proceedings of SPIE--the International Society for Optical Engineering ; v. 816.
Subjects:	Holographic interferometry > Congresses. Interférométrie holographique > Congrès. Holographic interferometry. METROLOGY. SPECKLE INTERFEROMETRY. INTERFEROMETRY. CONFERENCES. Conference papers and proceedings.

St. Cloud State University

Holdings details from St. Cloud State University
Call Number:	TS510 .P632 v. 816