Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics, 2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A.

Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics, 2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A. /

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Bibliographic Details
Corporate Authors: Materials Research Society. Fall Meeting, Symposium O, "Materials, Processes, and Reliability for Advanced Interconnects for Micro- and Nanoelectronics"
Other Authors: Baklanov, Mikhail
Format: Conference Proceeding Book
Language:English
Published: Warrendale, Pa. : Cambridge ; New York : Materials Research Society ; Cambridge University Press, 2012.
Series:Materials Research Society symposia proceedings; v. 1335.
Subjects:
Interconnects (Integrated circuit technology) > Congresses.
Integrated circuits > Very large scale integration > Congresses
Microelectronics > Congresses
Nanoelectronics > Congresses.
Materials > Congresses

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