Scanning probe microscopy : characterization, nanofabrication and device application of functional materials /
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| Corporate Author: | |
|---|---|
| Other Authors: | , , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Dordrecht ; Boston :
Kluwer Academic Publishers,
©2005.
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| Series: | NATO science series. Mathematics, physics, and chemistry ;
v. 186. |
| Subjects: |