The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling /

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Bibliographic Details
Main Author: Pindera, M.-J. (Marek-Jerzy), 1951-
Corporate Author: NASA Glenn Research Center
Other Authors: Aboudi, Jacob, 1935-, Arnold, S. M.
Format: Government Document Book
Language:English
Published: Cleveland, Ohio : Hanover, Md. : Springfield, Va. : National Aeronautics and Space Administration, Glenn Research Center ; Available from NASA Center for Aerospace Information ; National Technical Information Service [distributor], [1999]
Cleveland, Ohio : Hanover, MD : Springfield, VA : [1999]
Series:NASA technical memorandum 209770.
Subjects: