Ellipsometry in the measurement of surfaces and thin films : symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C.

Ellipsometry in the measurement of surfaces and thin films : symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C. /

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Bibliographic Details
Corporate Author: Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
Other Authors: Passaglia, Elio, Stromberg, R. R., Kruger, Jerome
Format: Government Document Conference Proceeding Book
Language:English
Published: Washington, D.C. : U.S. National Bureau of Standards, 1964.
Series:National Bureau of Standards miscellaneous publication ; 256.
Subjects:
Polarization (Light) > Congresses.
Surfaces (Technology) > Congresses.
Thin films > Congresses.
Conference papers and proceedings.

MARC

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