Ellipsometry in the measurement of surfaces and thin films : symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C. /
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| Corporate Author: | |
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| Other Authors: | , , |
| Format: | Government Document Conference Proceeding Book |
| Language: | English |
| Published: |
Washington, D.C. :
U.S. National Bureau of Standards,
1964.
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| Series: | National Bureau of Standards miscellaneous publication ;
256. |
| Subjects: |