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|a (OCoLC)35138770
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|a TN689.2
|b .I552a vol. 23
|a TN689.2
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| 082 |
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|a 669.95 s
|a 669/.95
|2 20
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| 110 |
2 |
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|a International Metallographic Society.
|b Technical Meeting
|n (28th :
|d 1995 :
|c Albuquerque, New Mexico)
|
| 245 |
1 |
0 |
|a Advances and applications in the metallography and characterization of materials and microelectronic components :
|b proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society /
|c edited by D.W. Stevens [and others].
|
| 260 |
|
|
|a Columbus, Ohio :
|b International Metallographic Society ;
|a Materials Park, Ohio :
|b ASM International,
|c ©1996.
|
| 300 |
|
|
|a xi, 318 page :
|b illustrations ;
|c 29 cm.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
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|a volume
|b nc
|2 rdacarrier
|
| 490 |
1 |
|
|a Microstructural science ;
|v v. 23
|
| 500 |
|
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|a Meeting held in Albuquerque, New Mexico, July 23-26, 1995.
|
| 504 |
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|a Includes bibliographical references.
|
| 650 |
|
0 |
|a Metallography
|v Congresses.
|
| 650 |
|
0 |
|a Metallography
|x Industrial applications
|x Congresses.
|
| 650 |
|
0 |
|a Microelectronics
|x Materials
|x Microscopy
|x Congresses.
|
| 700 |
1 |
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|a Stevens, D. W.
|
| 773 |
1 |
8 |
|g no:23
|w 9927091990001701
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| 830 |
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|a Microstructural science ;
|v v. 23.
|
| 999 |
1 |
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|m advances_and_applications_in_the_metallography_and_characterization_of_____1996_______intera________________________________________international_metall_______________p
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