Advances and applications in the metallography and characterization of materials and microelectronic components : proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society /
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| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Columbus, Ohio : Materials Park, Ohio :
International Metallographic Society ; ASM International,
©1996.
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| Series: | Microstructural science ;
v. 23. |
| Subjects: |