Defects in SiO₂ and related dielectrics : science and technology /

Saved in:

Bibliographic Details
Corporate Author:	NATO Advanced Study Institute on Defects in SiO□b2□s and Related Dielectrics: Science and Technology
Other Authors:	Pacchioni, G. (Gianfranco), 1954-, Skuja, L. (Linards), Griscom, David L.
Format:	Conference Proceeding Book
Language:	English
Published:	Dordrecht, Netherlands, Boston, Mass. : Kluwer Academic Publishers, ©2000.
Series:	NATO science series. Mathematics, physics, and chemistry vol. 2.
Subjects:	Silica > Electric properties > Congresses. Crystals > Defects > Congresses

University of Minnesota

Holdings details from University of Minnesota
Call Number:	QD181.S6 D43 2000