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  1. 1
    P-polarized reflectance spectroscopy : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions

    P-polarized reflectance spectroscopy : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions by Dietz, Nikolaus

    [Washington, D.C.] : [Springfield, Va.] : [National Aeronautics and Space Administration] ; [National Technical Information Service, distributor], 1995
    Format: Government Document Book


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  2. 2
    Defect characterization in ZnGeP₂ by time-resolved photoluminescence

    Defect characterization in ZnGeP₂ by time-resolved photoluminescence

    [Washington, D.C.] : [Springfield, Va.] : [National Aeronautics and Space Administration] ; [National Technical Information Service, distributor], 1995
    Other Authors: “…Dietz, Nikolaus…”
    Format: Government Document Book


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