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    Electronic characterization of defects in narrow gap semiconductors : comparison of electronic energy levels and formation energies in Mercury Cadmium Telluride Mercury Zinc Telluride and Mercury Zinc Selenide, semi-annual report, September 19, 1994 to March 19, 1995

    Electronic characterization of defects in narrow gap semiconductors : comparison of electronic energy levels and formation energies in Mercury Cadmium Telluride Mercury Zinc Tellur... by Patterson, James D. (James Deane), 1934-

    [Washington, D.C.] : [Springfield, Va.] : [National Aeronautics and Space Administration] ; [National Technical Information Service, distributor], 1995
    Format: Government Document Book


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