Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films

Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films /

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Bibliographic Details
Main Author: Czanderna, Alvin Warren, 1930-
Corporate Authors: United States. Department of Energy. Division of Solar Energy, Solar Energy Research Institute, Clarkson College of Technology
Other Authors: Helbig, H., Prince, Eric T.
Format: Government Document Book
Language:English
Published: [Washington] : Dept. of Energy, Division of Solar Technology, 1978.
Series:SERI/TP ; 31-064
Subjects:
Thin films > Optical properties > Measurement.
Specular reflectance > Measurement.
Mass (Physics) > Measurement
Description
Item Description:Contract EG-77-C-01-4042.
Issued Nov. 1978.
Physical Description:iv, 14 pages : illustrations ; 28 cm
Bibliography:Includes bibliographical references.

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