Nanostructures and microstructure correlation with physical properties of semiconductors : 20-21 March, 1990, San Diego, California /

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Bibliographic Details
Corporate Authors: Society of Photo-Optical Instrumentation Engineers, Society of Vacuum Coaters, SPIE Symposium on Advances in Semiconductors and Superconductors: Physics Toward Device Applications
Other Authors: Craighead, Harold G., Gibson, J. M. (John Murray), 1954-
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash., USA : SPIE, ©1990.
Series:Proceedings of SPIE--the International Society for Optical Engineering v. 1284.
Subjects:
Description
Item Description:Includes index.
"The papers contained in the proceedings of the SPIE Symposium on Advances in Semiconductors and Superconductors: Physics toward Device Applications, held 17-21 March 1990 in San Diego, California..."
Physical Description:x, 268 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.
ISBN:0819403350
ISSN:0277-786X ;