Method to determine the quality of sapphire /

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Bibliographic Details
Corporate Authors: United States. National Bureau of Standards, RCA Laboratories
Other Authors: Duffy, M. T.
Format: Government Document Book
Language:English
Published: Washington : Dept. of Commerce, National Bureau of Standards: for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980.
Series:Semiconductor measurement technology.
NBS special publication ; 400-62.
Subjects:

MARC

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110 1 |a United States.  |b National Bureau of Standards. 
245 1 0 |a Method to determine the quality of sapphire /  |c M. T. Duffy, RCA Laboratories ... [et al.]. 
260 |a Washington :  |b Dept. of Commerce, National Bureau of Standards: for sale by the Supt. of Docs., U.S. Govt. Print. Off.,  |c 1980. 
300 |a xiii, 61 p. :  |b ill. ;  |c 27 cm. 
440 0 |a Semiconductor measurement technology. 
490 1 |a NBS special publication ; 400-62. 
500 |a Issued Aug. 1980. 
504 |a Includes bibliographical references. 
650 0 |a Sapphires  |x Testing. 
700 1 |a Duffy, M. T. 
710 2 |a RCA Laboratories. 
830 0 |a NBS special publication ;  |v 400-62. 
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