Method to determine the quality of sapphire /
Saved in:
Corporate Authors: | , |
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Other Authors: | |
Format: | Government Document Book |
Language: | English |
Published: |
Washington :
Dept. of Commerce, National Bureau of Standards: for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
1980.
|
Series: | Semiconductor measurement technology.
NBS special publication ; 400-62. |
Subjects: |
MARC
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005 | 20241003000000.0 | ||
008 | 800820s1980 dcua b f00010 eng d | ||
040 | |a GPO |c GPO |d MvI-ran |d MvI | ||
040 | |d MvI | ||
049 | |a MPHU | ||
074 | |a 247 | ||
086 | 0 | |a C 13.10:400-62 | |
110 | 1 | |a United States. |b National Bureau of Standards. | |
245 | 1 | 0 | |a Method to determine the quality of sapphire / |c M. T. Duffy, RCA Laboratories ... [et al.]. |
260 | |a Washington : |b Dept. of Commerce, National Bureau of Standards: for sale by the Supt. of Docs., U.S. Govt. Print. Off., |c 1980. | ||
300 | |a xiii, 61 p. : |b ill. ; |c 27 cm. | ||
440 | 0 | |a Semiconductor measurement technology. | |
490 | 1 | |a NBS special publication ; 400-62. | |
500 | |a Issued Aug. 1980. | ||
504 | |a Includes bibliographical references. | ||
650 | 0 | |a Sapphires |x Testing. | |
700 | 1 | |a Duffy, M. T. | |
710 | 2 | |a RCA Laboratories. | |
830 | 0 | |a NBS special publication ; |v 400-62. | |
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