Applied logistic regression /

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Bibliographic Details
Main Author:	Hosmer, David W.
Other Authors:	Lemeshow, Stanley
Format:	Book
Language:	English
Published:	New York : Wiley, ©1989.
Series:	Wiley series in probability and mathematical statistics. Applied probability and statistics
Subjects:	Regression analysis. Regression Analysis Analyse de régression. Méthodes statistiques. Analyse de régression. Biostatistik Epidemiologie Regressionsanalyse Regressieanalyse.

Applied logistic regression by Hosmer, David W.

New York : Wiley, 2000
Second edition.

Format: Book