Electrochemical interfaces for energy storage and conversion : fundamental insights from experiments to computations : April 1-5, 2013, San Francisco, California, USA /
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Corporate Authors: | , |
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Format: | Book |
Language: | English |
Published: |
Cambridge :
Cambridge University Press,
[2013]
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Series: | Materials Research Society symposia proceedings ;
v. 1542. |
Subjects: |
Table of Contents:
- Defect engineered multi-walled carbon nanotube arrays as electrochemical double layer capacitors / R. Narayanan, M. Hoefer, P. Bandaru
- High temperature stability of silver based porous nanocomposites for electrochemical devices / A. Sarikaya, V. Petrovsky, F. Dogan
- Stability and performance of YSZ infiltrated platinum electrodes for sensors and solid oxide cells / A. Buyukaksoy, V. Petrovsky, F. Dogan
- The structure of water on rutile TiO2(110) for applications in solar hydrogen production : towards a predictive model using hybrid-exchange density functional theory / M. Patel, G. Mallia, N. Harrison
- Sr-diffusion in Ce0.8Gd8.2O2-8 layers for SOFC application / T. Mandt, C. Korte, U. Breuer, A.Weber, M. Ziegner, S. Uhlenbruck, N. Menzler, D. Stolten
- Effect of reducing agent on the dispersion of Pt nanoparticles on electrospun Nb0.1Ti0.9O2 nanofibers / E. Alvar, B. Zhou, S. Eichhorn
- Cahn-Hilliard reaction model for isotropic Li-ion battery particles / Y. Zeng, M. Bazant
- Electrochemical reduction of CO2 using supported Cu2O catalysts / J. Bugayong, G. Griffin
- Catalytic activity of ceria-based complex metal oxides in alkaline and acidic environments / M. Schrandt, P. Kolla, A. Smirnova
- Protons crossing triple phase boundaries based on Pd and barium zirconate : a density functional theory study / M. Malagoli, A. Bongiorno
- Strain states in YSZ/Re2O3(RE=Er,Y) multilayers as a function of layer thickness and their effect on interface conductivity and diffusion / J. Keppner, C. Korte, J. Schubert, W. Zander, M. Ziegner, D. Stolten
- Electrochemical investigation into the dissolution mechanism of anodic oxide films on silicon / D. Liu, D. Blackwood.