Advanced scanning electron microscopy and X-ray microanalysis /
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| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
New York :
Plenum Press,
©1986.
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| Subjects: |
| Item Description: | Includes index. |
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| Physical Description: | xii, 454 pages : illustrations ; 24 cm |
| Bibliography: | Bibliography: pages 315-322. |
| ISBN: | 0306421402 |