Characterization of epitaxial semiconductor films /
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| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
Amsterdam ; New York :
Elsevier Scientific Pub. Co.,
1976.
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| Series: | Methods and phenomena, their applications in science and technology ;
v. 2. |
| Subjects: |
| Item Description: | "Published as a special issue of Thin solid films, vol. 31, issues 1 and 2." |
|---|---|
| Physical Description: | xii, 216 pages : illustrations ; 25 cm. Also issued online. |
| Bibliography: | Includes bibliographical references. |
| ISBN: | 044441438X (American Elsevier) 9780444414380 (American Elsevier) |