Grain boundary oxidation and fatigue crack growth at elevated temperatures

Grain boundary oxidation and fatigue crack growth at elevated temperatures /

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Bibliographic Details
Main Author: Liu, H. W. (Hao Wen), 1926-
Corporate Author: United States. National Aeronautics and Space Administration
Other Authors: Oshida, Yoshiki
Format: Government Document Book
Language:English
Published: [Washington, DC] : [Springfield, Va.] : [National Aeronautics and Space Administration] ; [National Technical Information Service, distributor], [1986]
Series:NASA contractor report ; NASA CR-179529.
Subjects:
Crack propagation.
Grain boundaries.
Metal fatigue.
Oxidation.
Description
Item Description:Distributed to depository libraries in microfiche.
Physical Description:1 volume.

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