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Auger spectroscopic analysis of S-1 photocathodes. by Rusch, Thomas William
1969Call Number: Loading…
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An investigation of Ag-O-Cs photoemissive surfaces using auger electron spectroscopy. by Rusch, Thomas William
1973Call Number: Loading…
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X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, 1986Other Authors: “…Rusch, Thomas William…”
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